Digital image correlation-based analysis of strain accumulation on a duplex g-TiAl

This paper discusses the experimental results obtained for a duplex g-TiAl alloy deformed at room temperature. High resolution digital image correlation was used to measure local strain fields. The characterization of the microstructure was performed using optical microscopy and a precise correlation between the strain fields and the microstructure was found. High local strains were measured along well-oriented lamellar grains, in particular for the g-phase. Furthermore, the analysis of the two- dimensional strain tensor shows that the largest strain component is the shear strain in the plane of the lamellar grains. This study aims to provide further understanding of the deformation behavior of g- TiAl alloys