Sfoglia per Autore
Strain-induced shift of phonon modes in Si1-xGex alloys
2006-01-01 F., Pezzoli; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KAENEL; E., Wintersberger; J., Stangl; G., Bauer
Analysis of strain relaxation by microcracks inepitaxial GaAs grown on Ge/Si substrates
2007-01-01 M., Bonfanti; H., Von Kaenel; D., Colombo; A., Fedorov; E., Grilli; M., Guzzi; Isella, Giovanni; S., Marchionna; E., Mueller; S., Sanguinetti
Effective mass measurement: influence of hole band non parabolicity in SiGe/Ge quantum wells
2007-01-01 B., Batlogg; Chrastina, Daniel; Isella, Giovanni; B., Roessner; H., Von Kaenel
Defect analysis of hydrogenated nanocrystalline Si thin films
2007-01-01 A., Cavallini; D., Cavalcoli; M., Rossi; A., Tomasi; S., Pizzini; Chrastina, Daniel; Isella, Giovanni
Resonator fabrication for switchable two-color MIR detectors based on p-type SiGe quantum cascade injectors
2007-01-01 M., Grydlik; P., Rauter; T., Fromherz; C., Falub; D., Gruetzmacher; Isella, Giovanni; G., Bauer
Heterojunction photodiodes fabricated form Ge/Si (100) layers grown by low-energy plasma-enhanced CVD
2007-01-01 Isella, Giovanni; R., Kaufmann; M., Kummer; Osmond, Johann; H., Von Kaenel
Si/SiGe bound-to-continuum quantum cascade terahertz emitters
2008-01-01 D. J., Paul; G., Matmon; L., Lever; Z., Ikoni; R. W., Kelsall; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL
Ge/SiGe multiple quantum wells for optical applications
2008-01-01 Chrastina, Daniel; A., Neels; M., Bonfanti; M., Virgilio; Isella, Giovanni; E., Grilli; M., Guzzi; G., Grosso; H., Sigg; H., VON KAENEL
Procedimento per la fabbricazione di canali nanometrici
2008-01-01 Sordan, Roman; Isella, Giovanni
An experimental and theoretical investigation of a magnetically confined dc plasma discharge
2008-01-01 Rondanini, Maurizio; Cavallotti, CARLO ALESSANDRO; D., Ricci; Chrastina, Daniel; Isella, Giovanni; Moiseev, Tamara; VON KÄNEL, Hans
SiGe wet chemical etchants with high compositional selectivity and low strain sensitivity
2008-01-01 M., Stoffel; A., Malachias; T., Merdzhanova; F., Cavallo; Isella, Giovanni; Chrastina, Daniel; H., VON KÄNEL; A., Rastelli; O. G., Schmidt
Structural characterization of nc-Si films grown by low-energy PECVD on different substrates
2008-01-01 A., LE DONNE; S., Binetti; Isella, Giovanni; B., Pichaud; M., Texier; M., Acciarri; S., Pizzini
High speed Ge photodetector integrated on silicon-on-insulator operating at very low bias voltage
2008-01-01 Osmond, Johann; Isella, Giovanni; Chrastina, Daniel; R., Kaufmann; H., VON KANEL
Advances in structural characterization of thin film nanocrystalline silicon for photovoltaic applications
2008-01-01 A., LE DONNE; S., Binetti; Isella, Giovanni; B., Pichaud; M., Texier; M., Acciarri; S., Pizzini
ESiGe/Si quantum cascade structures deposited by low-energy plasma-enhanced CVD
2008-01-01 Isella, Giovanni; G., Matmon; A., Neels; E., Muller; M., Califano; Chrastina, Daniel; H., VON KANEL; L., Lever; Z., Ikonic; R. W., Kelsall; D. J., Paul
Si/SiGe Bound-to-Continuum Quantum Cascade Emitters
2008-01-01 D. J., Paul; G., Matmon; L., Lever; Z., Ikonic; R., Kelsall; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E. MÜLLER: A., Neels
Epitaxial Si-Ge Heterostructures and Nanostructures for Optical and Electrical Applications
2008-01-01 H., VON KÄNEL; M., Bollani; M., Bonfanti; Chrastina, Daniel; D., Colombo; A., Dommann; M., Guzzi; Isella, Giovanni; Miranda, ALESSIO MASSIMILIA; E., Müller; A., Neels; Osmond, Johann; B., Rössner; Sordan, Roman; F., Traversi
Structural Homogeneity of nc-Si Films Grown by Low-Energy PECVD
2008-01-01 A., LE DONNE; S., Binetti; Isella, Giovanni; S., Pizzini
Gate-controlled rectifying barrier in a two-dimensional hole gas
2008-01-01 Sordan, Roman; Miranda, ALESSIO MASSIMILIA; Osmond, Johann; D., Colombo; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL
RAMAN SPECTROSCOPY DETERMINATION OF COMPOSITION AND STRAIN IN SI1-XGEX/SI HETEROSTRUCTURES
2008-01-01 F., Pezzoli; E., Bonera; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E., Wintersberger; J., Stangl; G., Bauer
Phonon strain shift coefficients in Si1−xGex alloys
2008-01-01 F., Pezzoli; E., Bonera; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E., Wintersberger; J., Stangl; G., Bauer
Optical transitions in Ge/SiGe multiple quantum wells with Ge-rich barriers
2008-01-01 M., Bonfanti; E., Grilli; M., Guzzi; M., Virgilio; G., Grosso; Chrastina, Daniel; Isella, Giovanni; H., VON KAENEL; A., Neels
Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy
2008-01-01 D., Cavalcoli; M., Rossi; A., Tomasi; A., Cavallini; Chrastina, Daniel; Isella, Giovanni
Ge/Si (100) heterojunction photodiodes fabricated from material grown by low energy plasma enhanced chemical vapour deposition
2008-01-01 Osmond, Johann; Isella, Giovanni; Chrastina, Daniel; R., Kaufmann; H., VON KÄNEL
Raman Spectroscopy for the Analysis of Temperature-Dependent Plastic Relaxation of SiGe Layers
2009-01-01 F., Pezzoli; E., Bonera; M., Bollani; S., Sanguinetti; E., Grilli; M., Guzzi; Isella, Giovanni; Chrastina, Daniel; H., Von Kaenel
Ultra low dark current Ge/Si photodiodes with low thermal budget
2009-01-01 Osmond, Johann; Isella, Giovanni; Chrastina, Daniel; R., Kaufmann; M., Acciarri; H., Von Kaenel
Positron annihilation studies of defects in Si1-xGex/SOI heterostructures
2009-01-01 Calloni, Alberto; Ferragut, RAFAEL OMAR; Moia, Fabio; Dupasquier, Alfredo; Isella, Giovanni; D., Marongiu; Norga, GERD JOHAN MARIA; A., Fedorov; Chrastina, Daniel
Raman Spectroscopy for the Analysis οf Temperature Dependent Plastic Relaxation οf SiGe Layers
2009-01-01 F., Pezzoli; E., Bonera; Bollani, Monica; S., Sanguinetti; E., Grilli; M., Guzzi; Isella, Giovanni; Chrastina, Daniel; H., von Känel
Plasma Composition and Kinetic Reaction Rates in a LEPECVD Ar-SiH4-H2 Plasma Durign nc-Si Films Deposition for Photovoltaic Applications
2009-01-01 Moiseev, Tamara; Chrastina, Daniel; Isella, Giovanni; Cavallotti, CARLO ALESSANDRO
Direct gap related optical transitions in Ge/SiGe quantum wells
2009-01-01 M., Bonfanti; E., Grilli; M., Guzzi; Chrastina, Daniel; Isella, Giovanni; H., von Kaenel; H., Sigg
Vertical arrays of nanofluidic channels fabricated without nanolithography
2009-01-01 Sordan, Roman; Miranda, ALESSIO MASSIMILIA; F., Traversi; D., Colombo; Chrastina, Daniel; Isella, Giovanni; M., Masserini; L., Miglio; K., Kern; K., Balasubramanian
An Investigation Of The Gas Phase And Surface Chemistry Active During The Pecvd Of Nc-Silicon: A Detailed Model Of The Gas Phase And Surface Chemistry
2009-01-01 Cavallotti, CARLO ALESSANDRO; Rondanini, Maurizio; Moiseev, Tamara; Chrastina, Daniel; Isella, Giovanni
Polarization-dependent absorption in Ge/SiGe multiple quantum wells
2009-01-01 M., Virgilio; M., Bonfanti; Chrastina, Daniel; A., Neels; Isella, Giovanni; E., Grilli; M., Guzzi; G., Grosso; H., Sigg; H., VON KAENEL
Threshold ionization mass spectrometry in the presence of excited silane radicals
2009-01-01 Moiseev, Tamara; Chrastina, Daniel; Isella, Giovanni; Cavallotti, CARLO ALESSANDRO
Ultrafast nonlinear optical response of photoexcited Ge/SiGe quantum wells: Evidence for a femtosecond transient population inversion
2009-01-01 C., Lange; N. S., Koester; S., Chatterjee; H., Sigg; Chrastina, Daniel; Isella, Giovanni; H., Von Kaenel; M., Schaefer; M., Kira; S. W., Koch
Langmuir probe plasma parameters and kinetic rates in a Ar-SiH4-H-2 plasma during nc-Si films deposition for photovoltaic applications
2009-01-01 Moiseev, Tamara; Isella, Giovanni; Chrastina, Daniel; Cavallotti, CARLO ALESSANDRO
Impact of misfit dislocations on wavefront distortion in Si/SiGe/Si optical waveguides
2009-01-01 A., Trita; F., Bragheri; I., Cristiani; V., Degiorgio; Chrastina, Daniel; Colombo, Davide; Isella, Giovanni; H., Von Kaenel; F., Gramm; E., Muueller; M., Doebeli
Fabrication of High Efficiency III_V Quantum Nanostructures at Low Thermal Budget on Si
2009-01-01 S., Bietti; Sanguinetti, C. S. o. m. a. s. c. h. i. n. i. S.; N., Kogushi; Isella, Giovanni; Chrastina, Daniel
Crystallinity and microstructure in Si films grown by plasma-enhanced chemical vapor deposition: A simple atomic-scale model validated by experiments
2009-01-01 P. L., Novikov; A. L., Donne; S., Cereda; L., Miglio; S., Pizzini; S., Binetti; Rondanini, Maurizio; Cavallotti, CARLO ALESSANDRO; Chrastina, Daniel; Moiseev, Tamara; H. v., Kanel; Isella, Giovanni; F., Montalenti
Fabrication of GaAs quantum dots by droplet epitaxy on Si/Ge virtual substrate
2009-01-01 S., Bietti; S., Sanguinetti; C., Somaschini; N., Koguchi; Isella, Giovanni; Chrastina, Daniel; A., Fedorov
Tuning by means of laser annealing of electronic and structural properties of nc-Si/a-Si:H
2009-01-01 E., Poliani; C., Somaschini; S., Sanguinetti; E., Grilli; M., Guzzi; A., Le Donne; S., Binetti; Chrastina, Daniel; Isella, Giovanni
Elastic strain relief in a single lithographic SiGe nanostructure by nanobeam X-ray diffraction
2010-01-01 Tagliaferri, Alberto; Chrastina, Daniel; Vanacore, GIOVANNI MARIA; Zani, Maurizio; Bollani, Monica; Schöder, S.; Burghammer, M.; Boye, P.; Isella, Giovanni; Sordan, Roman
Size Evolution of Ordered SiGe Islands Grown by Surface Thermal Diffusion on Pit-Patterned Si(100) Surface
2010-01-01 Vanacore, GIOVANNI MARIA; Zani, Maurizio; Bollani, Monica; Colombo, Davide; Isella, Giovanni; Osmond, Johann; Sordan, Roman; Tagliaferri, Alberto
Quantum-confined Stark effect measurements in Ge/SiGe quantum-well structures
2010-01-01 P., Chaisakul; D., Marris Morini; Isella, Giovanni; Chrastina, Daniel; X., Le Roux; E., Gatti; S., Edmond; Osmond, Johann; E., Cassan; L., Vivien
Raman efficiency in SiGe alloys
2010-01-01 A., Picco; E., Bonera; E., Grilli; M., Guzzi; M., Giarola; G., Mariotto; Chrastina, Daniel; Isella, Giovanni
Quantitative investigation of the influence of carbon surfactant on Ge surface diffusion and island nucleation on Si(100)
2010-01-01 Vanacore, GIOVANNI MARIA; Zani, Maurizio; Isella, Giovanni; Osmond, Johann; Bollani, Monica; Tagliaferri, Alberto
Spin polarized photoemission from Ge based heterostructures
2010-01-01 Bottegoni, Federico; A., Ferrari; Marcon, Marco; Isella, Giovanni; Chrastina, Daniel; S., Cecchi; Ciccacci, Franco
Photoluminescence Study of Low Thermal Budget III-V Nanostructures on Silicon by Droplet Epitaxy
2010-01-01 S., Bietti; C., Somaschini; E., Sarti; N., Koguchi; S., Sanguinetti; Isella, Giovanni; Chrastina, Daniel; A., Fedorov
Low thermal budget fabrication of III-V quantum nanostructures on Si substrates
2010-01-01 S., Bietti; C., Somaschini; S., Sanguinetti; N., Koguchi; Isella, Giovanni; Chrastina, Daniel; A., Fedorov
Defect characterization in SiGe/SOI epitaxial semiconductors by positron annihilation
2010-01-01 Ferragut, RAFAEL OMAR; Calloni, Alberto; Dupasquier, Alfredo; Isella, Giovanni
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