RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano

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Mostrati risultati da 51 a 100 di 240
Titolo Data di pubblicazione Autori File
Modeling of stress-induced leakage current and impact ionization in MOS devices 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Modeling of anomalous SILC in Flash memories based on tunneling at multiple defects 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical profiling of SILC spot in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Two-dimensional quantum effects in nanoscale MOSFETs 1-gen-2002 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Simulation of polysilicon quantization and its effect on n-and p-MOSFET performance 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Laser-based calibration for the HARP time of flight system 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Program/erase dynamics and channel conduction in nanocrystal memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
The laser calibration system of the HARP TOF 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Experimental and Monte Carlo analysis of drain-avalanche hot-hole injection for reliability optimization in Flash memories 1-gen-2003 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
2D QM simulation and optimization of decanano non-overlapped MOS devices 1-gen-2003 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Analysis of quantum yield in n-channel MOSFETs 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Photon time-of-flight distribution through turbid media directly measured with single-photon avalanche diodes 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRORECH, IVAN +
Towards integrating the functions of cells with electrical processes 1-gen-2004 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDRO
Optimization of the nonoverlap length in decanano MOS devices with 2-D QM simulations 1-gen-2004 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Impact of correlated generation of oxide defects on SILC and breakdown distributions 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Detection of nondelayed photons in the forward-scattering of picosecond pulses 1-gen-2004 SOTTOCORNOLA SPINELLI, ALESSANDROZAMBRA, GUIDO +
Defect generation statistics in thin gate oxides 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A comparative study of characterization techniques for oxide reliability in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Counting photoelectrons in the response of a photomultiplier tube to single picosecond light pulses 1-gen-2004 ZAMBRA, GUIDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical analysis of nanocrystal memory reliability 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
High-energy oxide traps and anomalous soft-programming in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Biocompatibility of semiconductor chip surface materials 1-gen-2005 GIORDANO, CARMENRAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROCIOFFI, MARGHERITAGUSMEROLI, RICCARDO +
Integrating live cells with semiconductor devices: a biocompatibility assay 1-gen-2005 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROBARANAUSKAS, GYTIS
Reliability assessment of discrete-trap memories for NOR applications 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOSOTGIU, RICCARDO
Optimization of threshold voltage window under tunneling program/erase in nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Program and SILC constraints on NC memories scaling: a Monte Carlo approach 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO +
A new charge-trapping technique to extract SILC-trap time constants in SiO2 1-gen-2005 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Edge and percolation effects on VT window in nanocrystal memories 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Recent developments on flash memory reliability 1-gen-2005 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Modeling of tunneling P/E for nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Performance improvement of ballistic double-gate devices and design trade-offs 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Impact of Source-Drain Tunneling on Double-Gate Performance 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Cell-based biosensors: current trends of the development 1-gen-2006 BARANAUSKAS, GYTISGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROGIORDANO, CARMENRAIMONDI, MANUELA TERESA
A switched-capacitor neural preamplifier with an adjustable pass-band for fast recovery following stimulation 1-gen-2006 GUSMEROLI, RICCARDOBONFANTI, ANDREA GIOVANNIBORGHI, TOMMASOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Characterization of transient currents in HfO2 capacitors in the short timescale 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Transient currents in HfO2 and their impact on circuit and memory applications 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A study of hot-hole injection during programming drain disturb in Flash memories 1-gen-2006 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Extraction of the floating-gate capacitive couplings for drain turn-on estimation in discrete-trap memories 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Threshold-voltage statistics and conduction regimes in nanocrystal memories 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELE
Characterization of oxide trap energy by analysis of the SILC roll-off regime in Flash memories 1-gen-2006 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Accurate Boundary Integral Calculation in Semiconductor Device Simulation 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Defects spectroscopy in SiO2 by statistical random telegraph noise analysis 1-gen-2006 GUSMEROLI, RICCARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Temperature dependence of transient and steady-state gate currents in HfO2 capacitors 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Method for programming/erasing a non volatile memory cell device, in particular for flash type memories 1-gen-2007 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Mostrati risultati da 51 a 100 di 240
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