RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano

Sfoglia per Autore  

Opzioni
Mostrati risultati da 101 a 150 di 499
Titolo Data di pubblicazione Autori File
Double-Index Averaging: A Novel Technique for Dynamic Element Matching in Sigma-Delta A/D Converters. 1-gen-1999 SAMORI, CARLOLACAITA, ANDREA LEONARDO +
Physics and characterization of transiet effects in SOI transistors. 1-gen-1999 LACAITA, ANDREA LEONARDO +
MOSFET simulation with quantum effects and non-local mobility model 1-gen-1999 SOTTOCORNOLA SPINELLI, ALESSANDROVILLA, STEFANOLACAITA, ANDREA LEONARDO +
Impact of indirect stability on phase noise performance of fully–integrated LC tuned VCOs 1-gen-1999 SAMORI, CARLOLACAITA, ANDREA LEONARDOLEVANTINO, SALVATORE +
Analysis of space and Energy Distribution of Stress-Induced Oxide traps 1-gen-1999 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
On surface roughness-limited mobility in highly doped n-MOSFET's. 1-gen-1999 LACAITA, ANDREA LEONARDO +
Quantum effects on the extraction of MOS oxide traps by 1/ƒ noise measurements 1-gen-1999 LACAITA, ANDREA LEONARDO +
Monte Carlo simulation of conductance characteristics in SOI-MOSFET. 1-gen-1999 LACAITA, ANDREA LEONARDO +
Experimental method for the determination of the energy distribution of stress-induced oxide traps 1-gen-1999 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDORIGAMONTI, MATTEO ANTONIO +
Explaining the Dependences of Electron and Hole Mobilities in Si MOSFETs Inversion Layer 1-gen-1999 LACAITA, ANDREA LEONARDO +
Modeling of SILC based on electron and hole tunneling - Part I: transient effects 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Quantum-mechanical 2D simulation of surface- and buried-channel p-MOS 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Polysilicon quantization effects on the electrical properties of MOS transistors 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Modeling of SILC based on electron and hole tunneling -- Part II: Steady-state 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
The impact of polysilicon quantization on ultra-thin oxide MOSFET characteristics 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Role of interface and bulk defect-states in the low-voltage leakage conduction of ultrathin oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Phase noise degradation at high oscillation amplitudes in LC-tuned VCO's 1-gen-2000 SAMORI, CARLOLACAITA, ANDREA LEONARDOLEVANTINO, SALVATORE +
Impact ionization and stress-induced leakage current in thin gate oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
New Formulas of Interconnect Capacitances Based on Results of Confocal Mapping Method 1-gen-2000 LACAITA, ANDREA LEONARDO +
Experimental evidence for recombination-assisted leakage in thin oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Accurate Doping Profile Extraction Near the Si/SiO2 Interface with a Novel Low Temperature C-V Technique 1-gen-2000 LACAITA, ANDREA LEONARDOPIROVANO, AGOSTINO +
Effect of oxide tunneling on the measurements of MOS interface states 1-gen-2000 LACAITA, ANDREA LEONARDO +
Explaining the dependences of the hole and electron mobilities in Si inversion layers 1-gen-2000 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Evidence for recombination at oxide defects and new SILC model 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A recombination model for transient and stationary stress-induced leakage current 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Experimental and numerical analysis of the quantum yield 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
On the correlation between surface roughness and inversion layer mobility in Si-MOSFET’s 1-gen-2000 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Statistical modeling of reliability and scaling projections for Flash memories 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
New technique for fast characterization of SILC distribution in Flash arrays 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A detailed investigation of the quantum yield experiment 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Fully 2D quantum-mechanical simulation of nanoscale MOSFETs 1-gen-2001 LACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
An Efficient Tool For Extraction of Interconnect Models in Submicron Layouts 1-gen-2001 MAFFEZZONI, PAOLOBRAMBILLA, ANGELO MAURIZIOLACAITA, ANDREA LEONARDO
A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Novel Low-temperature C-V Technique for MOS Doping Profile Determination Near The Si/SiO2 Interface 1-gen-2001 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
A fully-integrated low-power low-noise 2.6-GHz bipolar VCO for wireless applications 1-gen-2001 SAMORI, CARLOLEVANTINO, SALVATORELACAITA, ANDREA LEONARDO +
A recombination- and trap-assisted tunneling model for stress-induced leakage current 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
An improved formula for the determination of the polysilicon doping 1-gen-2001 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Different types of defects in silicon dioxide characterized by their transient behavior 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Automatic Amplitude Control Loop for a 2-V, 2.5-GHz LC-tank VCO 1-gen-2001 BONFANTI, ANDREA GIOVANNILEVANTINO, SALVATORESAMORI, CARLOLACAITA, ANDREA LEONARDO +
Impact of AAC design on phase noise performance of VCOs 1-gen-2001 SAMORI, CARLOLACAITA, ANDREA LEONARDOLEVANTINO, SALVATORE +
A 2-V 2.5-GHz – 104-dBc/Hz at 100kHz Fully Integrated VCO with Wide-Band Low-Noise Automatic Amplitude Control Loop 1-gen-2001 SAMORI, CARLOLEVANTINO, SALVATORELACAITA, ANDREA LEONARDO +
Monitoring Flash EEPROM reliability by equivalent cell analysis. 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Low jitter design of a 0.35-um-CMOS frequency divider operating up to 3 GHz 1-gen-2002 ROMANO', LUCALEVANTINO, SALVATORESAMORI, CARLOLACAITA, ANDREA LEONARDO +
A statistical model for SILC in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Equivalent cell approach for extraction of the SILC distribution in Flash EEPROM cells 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Modeling of anomalous SILC in Flash memories based on tunneling at multiple defects 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Correlated defect generation in thin oxides and its impact on Flash reliability 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Modeling of stress-induced leakage current and impact ionization in MOS devices 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical profiling of SILC spot in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Two-dimensional quantum effects in nanoscale MOSFETs 1-gen-2002 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Mostrati risultati da 101 a 150 di 499
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile