Sfoglia per Autore
Hole band nonparabolicity and effective mass measurement in p-SiGe/Ge heterostructures
2006-01-01 B., Roessner; B., Batlogg; H., VON KAENEL; Chrastina, Daniel; Isella, Giovanni
Measurement of carrier lifetime and interface recombination velocity in Si-Ge waveguides
2007-01-01 Chrastina, Daniel; I., Cristiani; V., Degiorgio; A., Trita; H., Von Kaenel
Defect analysis of hydrogenated nanocrystalline Si thin films
2007-01-01 A., Cavallini; D., Cavalcoli; M., Rossi; A., Tomasi; S., Pizzini; Chrastina, Daniel; Isella, Giovanni
Effective mass measurement: influence of hole band non parabolicity in SiGe/Ge quantum wells
2007-01-01 B., Batlogg; Chrastina, Daniel; Isella, Giovanni; B., Roessner; H., Von Kaenel
Measurement of lifetime of photo-generated free carriers in SiGe waveguides
2007-01-01 Chrastina, Daniel; I., Cristiani; V., Degiorgio; M., Doebeli; A., Trita; H., Von Kaenel
An experimental and theoretical investigation of a magnetically confined dc plasma discharge
2008-01-01 Rondanini, Maurizio; Cavallotti, CARLO ALESSANDRO; D., Ricci; Chrastina, Daniel; Isella, Giovanni; Moiseev, Tamara; VON KÄNEL, Hans
High speed Ge photodetector integrated on silicon-on-insulator operating at very low bias voltage
2008-01-01 Osmond, Johann; Isella, Giovanni; Chrastina, Daniel; R., Kaufmann; H., VON KANEL
Hydrogenated nanocrystalline silicon thin films studied by scanning force microscopy
2008-01-01 D., Cavalcoli; M., Rossi; A., Tomasi; A., Cavallini; Chrastina, Daniel; Isella, Giovanni
Ge/SiGe multiple quantum wells for optical applications
2008-01-01 Chrastina, Daniel; A., Neels; M., Bonfanti; M., Virgilio; Isella, Giovanni; E., Grilli; M., Guzzi; G., Grosso; H., Sigg; H., VON KAENEL
SiGe wet chemical etchants with high compositional selectivity and low strain sensitivity
2008-01-01 M., Stoffel; A., Malachias; T., Merdzhanova; F., Cavallo; Isella, Giovanni; Chrastina, Daniel; H., VON KÄNEL; A., Rastelli; O. G., Schmidt
RAMAN SPECTROSCOPY DETERMINATION OF COMPOSITION AND STRAIN IN SI1-XGEX/SI HETEROSTRUCTURES
2008-01-01 F., Pezzoli; E., Bonera; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E., Wintersberger; J., Stangl; G., Bauer
Si/SiGe bound-to-continuum quantum cascade terahertz emitters
2008-01-01 D. J., Paul; G., Matmon; L., Lever; Z., Ikoni; R. W., Kelsall; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL
Ge/Si (100) heterojunction photodiodes fabricated from material grown by low energy plasma enhanced chemical vapour deposition
2008-01-01 Osmond, Johann; Isella, Giovanni; Chrastina, Daniel; R., Kaufmann; H., VON KÄNEL
Si/SiGe Bound-to-Continuum Quantum Cascade Emitters
2008-01-01 D. J., Paul; G., Matmon; L., Lever; Z., Ikonic; R., Kelsall; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E. MÜLLER: A., Neels
Optical transitions in Ge/SiGe multiple quantum wells with Ge-rich barriers
2008-01-01 M., Bonfanti; E., Grilli; M., Guzzi; M., Virgilio; G., Grosso; Chrastina, Daniel; Isella, Giovanni; H., VON KAENEL; A., Neels
Phonon strain shift coefficients in Si1−xGex alloys
2008-01-01 F., Pezzoli; E., Bonera; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL; E., Wintersberger; J., Stangl; G., Bauer
ESiGe/Si quantum cascade structures deposited by low-energy plasma-enhanced CVD
2008-01-01 Isella, Giovanni; G., Matmon; A., Neels; E., Muller; M., Califano; Chrastina, Daniel; H., VON KANEL; L., Lever; Z., Ikonic; R. W., Kelsall; D. J., Paul
Gate-controlled rectifying barrier in a two-dimensional hole gas
2008-01-01 Sordan, Roman; Miranda, ALESSIO MASSIMILIA; Osmond, Johann; D., Colombo; Chrastina, Daniel; Isella, Giovanni; H., VON KÄNEL
Epitaxial Si-Ge Heterostructures and Nanostructures for Optical and Electrical Applications
2008-01-01 H., VON KÄNEL; M., Bollani; M., Bonfanti; Chrastina, Daniel; D., Colombo; A., Dommann; M., Guzzi; Isella, Giovanni; Miranda, ALESSIO MASSIMILIA; E., Müller; A., Neels; Osmond, Johann; B., Rössner; Sordan, Roman; F., Traversi
An Investigation Of The Gas Phase And Surface Chemistry Active During The Pecvd Of Nc-Silicon: A Detailed Model Of The Gas Phase And Surface Chemistry
2009-01-01 Cavallotti, CARLO ALESSANDRO; Rondanini, Maurizio; Moiseev, Tamara; Chrastina, Daniel; Isella, Giovanni
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