Sfoglia per Autore
Structure and properties of sputter-deposited BN thin films.
1996-01-01 M., Elena; Ielmini, Daniele; A., Miotello; Ossi, PAOLO MARIA
Separation of electron and hole traps by transient current analysis
1999-01-01 SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; Rigamonti, MATTEO ANTONIO; Ielmini, Daniele; G., Ghidini
Intersubband relaxation time for In[sub x]Ga[sub 1−x]As/AlAs quantum wells with large transition energy
1999-01-01 G., Ghislotti; E., Riedo; Ielmini, Daniele; Martinelli, Mario
Picosecond time-resolved luminescence studies of recombination processes in CdTe
1999-01-01 G., Ghislotti; Ielmini, Daniele; E., Riedo; Martinelli, Mario; M., Dellagiovanna
Modeling of SILC based on electron and hole tunneling -- Part II: Steady-state
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; M. A., Rigamonti; Lacaita, ANDREA LEONARDO
Modeling of SILC based on electron and hole tunneling - Part I: transient effects
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; M. A., Rigamonti; Lacaita, ANDREA LEONARDO
Impact ionization and stress-induced leakage current in thin gate oxides
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; G., Ghidini
Experimental evidence for recombination-assisted leakage in thin oxides
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
Role of interface and bulk defect-states in the low-voltage leakage conduction of ultrathin oxides
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; G., Ghidini
Evidence for recombination at oxide defects and new SILC model
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; G., Ghidini
A recombination model for transient and stationary stress-induced leakage current
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Martinelli; G., Ghidini
Experimental and numerical analysis of the quantum yield
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; D. J., Dimaria; G., Ghidini
A recombination- and trap-assisted tunneling model for stress-induced leakage current
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Martinelli; G., Ghidini
A new conduction mechanism for the anomalous cells in thin oxide Flash EEPROMs
2001-01-01 A., Modelli; F., Gilardoni; Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro
A detailed investigation of the quantum yield experiment
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; D. J., Di Maria; G., Ghioni
Statistical modeling of reliability and scaling projections for Flash memories
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
New technique for fast characterization of SILC distribution in Flash arrays
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; L., Confalonieri; A., Visconti
Different types of defects in silicon dioxide characterized by their transient behavior
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; M., Beretta; Lacaita, ANDREA LEONARDO
A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
Monitoring Flash EEPROM reliability by equivalent cell analysis.
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; M., Gubello; M., VAN DUUREN
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