Sfoglia per Autore
CMOS circuit analysis with luminescence measurements and simulations
2002-01-01 Stellari, Franco; Tosi, Alberto; Zappa, Franco; Cova, Sergio
Hot-carrier luminescence: comparison of different CMOS technologies
2003-01-01 Tosi, Alberto; F., Stellari; Zappa, Franco; Cova, Sergio
Back-side Flip-Chip testing by means of high-bandwidth luminescence detection
2003-01-01 Tosi, Alberto; Stellari, Franco; Zappa, Franco; Cova, Sergio
Luminescence measurements for the investigation of VLSI circuit defects
2003-01-01 Tosi, Alberto; Zappa, Franco; Cova, Sergio; Stellari, Franco
Backside Flip-Chip testing by means of high-bandwidth luminescence detection
2003-01-01 Tosi, Alberto; F., Stellari; Zappa, Franco; Cova, Sergio
CMOS Circuit Testing via Time-Resolved Luminescence Measurements and Simulations
2004-01-01 F., Stellari; Tosi, Alberto; Zappa, Franco; Cova, Sergio
Implementation of TRE systems into Emission Microscopes
2004-01-01 R., Desplats; P., Perdu; M., Remmach; Tosi, Alberto; Zappa, Franco
Current crowding in faulty MOSFET: optical and electrical investigation
2004-01-01 Tosi, Alberto; F., Stellari; Zappa, Franco
Implementation of TRE systems into Emission Microscopes
2004-01-01 Tosi, Alberto; M., Remmach; R., Desplats; Zappa, Franco; P., Perdu
Innovative packaging technique for Backside optical testing of wire-bonded chips
2005-01-01 Stellari, Franco; Tosi, Alberto; Zappa, Franco
Characterization of a 0.13 µm CMOS Link Chip using Time Resolved Emission (TRE)
2005-01-01 F., Stellari; P., Song; J., Hryckowian; O. A., Torreiter; S., Wilson; P., Wu; Tosi, Alberto
Single photon avalanche diodes for 1.5 µm photon counting applications
2005-01-01 M. A., Itzler; R., BEN MICHAEL; C. F., Hsu; K., Slomokowski; Tosi, Alberto; Cova, Sergio; Zappa, Franco; R., Ispasoiu
Innovative packaging technique for backside optical testing of wire-bonded chips
2005-01-01 Tosi, Alberto; F., Stellari; Zappa, Franco
Apparatus and methods for packaging electronic devices for optical testing
2005-01-01 Tosi, Alberto; F., Stellari; P., Song
System and method for estimation of integrated circuit signal characteristics using optical measurements
2005-01-01 Stellari, Franco; Tosi, Alberto; P., Song
Avalanche Diodes and Circuits for Infrared Photon Counting and Timing: Retrospect and Prospect
2006-01-01 Cova, Sergio; Zappa, Franco; Tosi, Alberto; Ghioni, MASSIMO ANTONIO
Time-resolved diffuse reflectance at null source-detector separation: a novel approach to photon migration
2006-01-01 Pifferi, ANTONIO GIOVANNI; Torricelli, Alessandro; Spinelli, Lorenzo; Cubeddu, Rinaldo; F., Martelli; G., Zaccanti; S., DEL BIANCO; Tosi, Alberto; Zappa, Franco; Cova, Sergio
Hot-carrier photoemission in scaled CMOS technologies: a challenge for emission based testing and diagnostics
2006-01-01 Tosi, Alberto; F., Stellari; A., Pigozzi; G., Marchesi; Zappa, Franco
Gated Operation of InGaAs SPADs with Active-Quenching and Fast Timing Circuits
2006-01-01 Tosi, Alberto; Gallivanoni, Andrea; Zappa, Franco; Cova, Sergio
Avalanche Diodes and Circuits for Infrared Photon Counting and Timing: Retrospect and Prospect
2006-01-01 Cova, Sergio; Tosi, Alberto; Gulinatti, Angelo; Zappa, Franco; Ghioni, MASSIMO ANTONIO
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