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Mostrati risultati da 1 a 20 di 224
Titolo Data di pubblicazione Autori File
"Struttura fotosensibile al colore di una radiazione luminosa" 1-gen-2006 LONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOLANGFELDER, GIACOMO
Low-noise real-time measurements of the position of movable structures in MEMS 1-gen-2008 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
The Transverse Field Detector (TFD): a novel color sensitive CMOS device 1-gen-2008 LONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOLANGFELDER, GIACOMOBOMBELLI, LUCA
A polysilicon test structure for fatigue and fracture testing in micro electro mechanical devices 1-gen-2008 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOCORIGLIANO, ALBERTOGHISI, ALDO FRANCESCO +
Luminous radiation colour photosensitive structure 1-gen-2008 LONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOLANGFELDER, GIACOMO
The Transverse Field Detector: a CMOS active pixel sensor capable of on-line tuning of the spectral response 1-gen-2009 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
Further developments on a novel color sensitive CMOS detector 1-gen-2009 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
A novel colour-sensitive CMOS detector 1-gen-2009 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
Isolation of Highly Doped Implants on Low-Doped Active Layers for CMOS Radiation Drift Detectors 1-gen-2009 LANGFELDER, GIACOMO
Tunable Spectral Responses in a Color-Sensitive CMOS Pixel for Imaging Applications 1-gen-2009 LANGFELDER, GIACOMOZARAGA, FEDERICOLONGONI, ANTONIO FRANCESCO
White balance in a color imaging device with electrically tunable color filters 1-gen-2009 LANGFELDER, GIACOMOZARAGA, FEDERICOLONGONI, ANTONIO FRANCESCO
Foto-rivelatore e metodo per rivelare una radiazione ottica 1-gen-2009 ZARAGA, FEDERICOLANGFELDER, GIACOMO
Polysilicon MEMS fatigue and fracture characterization via on chip testing. 1-gen-2009 CORIGLIANO, ALBERTOGHISI, ALDO FRANCESCOLANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
Real-time monitoring of the fatigue damage accumulation in polysilicon microstructures at different applied stresses. 1-gen-2009 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOCORIGLIANO, ALBERTOGHISI, ALDO FRANCESCO +
A new on-chip test structure for real time fatigue analysis in polysilicon MEMS 1-gen-2009 LANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOZARAGA, FEDERICOCORIGLIANO, ALBERTOGHISI, ALDO FRANCESCO +
A new two-beam differential resonant micro accelerometer 1-gen-2009 COMI, CLAUDIACORIGLIANO, ALBERTOLANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOTOCCHIO, ALESSANDRO +
On chip mechanical characterization using an electro-thermo-mechanical actuator 1-gen-2010 CORIGLIANO, ALBERTOLANGFELDER, GIACOMO +
White balance by tunable spectral responsivities 1-gen-2010 ZARAGA, FEDERICOLANGFELDER, GIACOMO
A resonant microaccelerometer with high sensitivity operating in an oscillating circuit. 1-gen-2010 COMI, CLAUDIACORIGLIANO, ALBERTOLANGFELDER, GIACOMOLONGONI, ANTONIO FRANCESCOTOCCHIO, ALESSANDRO +
Experimental Characterization of a CMOS Pixel with a Tunable Color Space 1-gen-2010 LANGFELDER, GIACOMOBUFFA, CESARELONGONI, ANTONIO FRANCESCOZARAGA, FEDERICO
Mostrati risultati da 1 a 20 di 224
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